Features:
n 4”, 6”, 8” & 12” chuck n Coaxial-driven chuck stage
n RF probing field upgradeable n 20X-4000X magnification
n Backlash free movement n Choice of microscope (tilt) up/down for E-Z revolving objectives
Accessories:
n RF probe/cables n Active probes n Low current/capacitance probe n High voltage probe
n Laser cutter n Ultrasonic cutter n CCTV n Photomicrographics
n Probe card holder n Packaged device holder n PCB holder n Thermal chuck
n Liquid crystal kit n Vibration free table n Shielding box n Test bench
n Instrument case with caster n Microscope quick lift n Dark field/normarski inspection n Chuck vacuum pattern
n Gold plated chuck
Specifications:
n 6” stainless steel vacuum chuck n Chuck stage 6”x6” travel
n Chuck theta 0-30° n Chuck up/down 4mm adjustable
n 12 micropositioner platen n 1”x1” travel microscope stage
Dimensions:
n 660mm W x 660mm D x 700mm H with microscope
n 60kg with microscope
Requirements:
n Electrical 110VAC, 60Hz, 220VAC, 60Hz
n Vacuum -250mm Hg, 7 litre/min
Station Type | Linear X-Y Chuck Stage | Chuck Up/Down | Chuck Fine Theta | Chuck Size Inch (mm) | Microscope X-Y Travel | U-Shaped RF Chuck | Probe Card Holder | Temp Range |
C-Series | P | P | Optional | 4-8 (100-200) | Optional | Optional | O | RT-700°C |
| C-2-RF | P | Optional | O | 2 (50) | O | P | O | RT-200°C |
EB-Series | P | P | Optional | 4-12 (100-300) | P | Optional | Rectangle | RT-700°C |
BD-Series | P | Platen up/down | Optional | 4-12 (100-300) | P | Optional | Round | RT-700°C |
EB-mmWave | P | P | Optional | 2-12 (50-300) | P | Optional | O | RT-600°C |
Photonic | P | P | P | 4-12 (100-300) | P | P | O | RT-700°C |
Environmental | P | Platen up/down | Optional | 4-8 (100-200) | P | Optional | Round | -60°C-200°C |
Cryogenic | O | O | O | 1-2 (30-50) | P | RF Probes | O | 4K-480K RT-750°C |